Explore NSN 5961-00-354-0676 Parts Catalog - (UX313332-5, UX313332-5, MA4106M4) under Semiconductor Device Set

NSN 5961-00-354-0676 is a Semiconductor Device Set part manufactured by Semi General Inc, Micrometrics Inc, Cobham Electronic Systems Inc, Edo Corporation. These items are compliant with fit, form, and functionality according to parameters set by the DLA. With over 3 billion new and obsolete NSN parts in our searchable NSN database, you can find your required NSN 5961-00-354-0676 parts with ease. We maintain an unmatched supply-chain network with trusted MFRs and verified PMAs. Do you require NSN part numbers other than UX313332-5, MA4106M4, 313332-5, W831AM? Related NSN parts defined by FSC 5961 Semiconductor Devices and Associated Hardware are listed below.

NSN 5961-00-354-0676 Information

Alternative NSN: 5961-00-354-0676
Item Name: Semiconductor Device Set
Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware
NIIN: 003540676
NCB Code: USA (00)
Manufacturers: Cobham Electronic Systems Inc , Edo Corporation , Micrometrics Inc , Semi General Inc

5961-00-354-0676 (5961003540676) - Semiconductor Device Set Part Details

Part No Manufacturer Item Name QTY RFQ
UX313332-5 semi general inc semiconductor device set Avl RFQ
UX313332-5 micrometrics inc semiconductor device set Avl RFQ
MA4106M4 cobham electronic systems inc semiconductor device set Avl RFQ
313332-5 edo corporation semiconductor device set Avl RFQ
W831AM cobham electronic systems inc semiconductor device set Avl RFQ

Characteristics Data of NSN 5961003540676

MRCCriteriaCharacteristic
ABBHINCLOSURE MATERIALGLASS
ABHPOVERALL LENGTH0.300 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE
ABJTTERMINAL LENGTH1.000 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE
ADAVOVERALL DIAMETER0.107 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE
AFZCFUNCTION FOR WHICH DESIGNEDMICROWAVE AND MIXER
ALASINTERNAL CONFIGURATIONPOINT CONTACT
ASDDCOMPONENT FUNCTION RELATIONSHIPMATCHED
ASKACOMPONENT NAME AND QUANTITY4 SEMICONDUCTOR DEVICE DIODE
AXGYMOUNTING METHODTERMINAL ALL SEMICONDUCTOR DEVICE DIODE
CTMZSEMICONDUCTOR MATERIALSILICON ALL SEMICONDUCTOR DEVICE DIODE
CTSGMAXIMUM OPERATING TEMP PER MEASUREMENT POINT150.0 DEG CELSIUS JUNCTION
FEATSPECIAL FEATURESMATCHED W/IN .005 VDC.
PMLCPRECIOUS MATERIAL AND LOCATIONTERMINAL SURFACES GOLD
PRMTPRECIOUS MATERIALGOLD
TTQYTERMINAL TYPE AND QUANTITY2 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE

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